Error Characterization and Coding Schemes for Flash Memories


Conference paper


Eitan Yaakobi, Paul H. Siegel, Steven Swanson, Jack Wolf, Laura Grupp, Jing Ma
IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), Miami, Florida, USA, pp. 1-5

Cite

Cite

APA   Click to copy
Yaakobi, E., Siegel, P. H., Swanson, S., Wolf, J., Grupp, L., & Ma, J. Error Characterization and Coding Schemes for Flash Memories. In IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010) (pp. 1–5). Miami, Florida, USA.


Chicago/Turabian   Click to copy
Yaakobi, Eitan, Paul H. Siegel, Steven Swanson, Jack Wolf, Laura Grupp, and Jing Ma. “Error Characterization and Coding Schemes for Flash Memories.” In IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), 1–5. Miami, Florida, USA, n.d.


MLA   Click to copy
Yaakobi, Eitan, et al. “Error Characterization and Coding Schemes for Flash Memories.” IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010), pp. 1–5.


BibTeX   Click to copy

@inproceedings{yaakobi-a,
  title = {Error Characterization and Coding Schemes for Flash Memories},
  address = {Miami, Florida, USA},
  pages = {1-5},
  author = {Yaakobi, Eitan and Siegel, Paul H. and Swanson, Steven and Wolf, Jack and Grupp, Laura and Ma, Jing},
  booktitle = {IEEE Globecom 2010 Workshop on Application of Communication Theory to Emerging Memory Technologies (ACTEMT 2010)}
}