Conference paper
MICRO 42, Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture, ACM, New York, NY, USA, 2009, pp. 24--33
APA
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Grupp, L. M., Caulfield, A. M., Coburn, J., Swanson, S., Yaakobi, E., Siegel, P. H., & Wolf, J. K. (2009). Characterizing flash memory: anomalies, observations, and applications. In Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture (pp. 24–33). New York, NY, USA: ACM.
Chicago/Turabian
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Grupp, Laura M., Adrian M. Caulfield, Joel Coburn, Steven Swanson, Eitan Yaakobi, Paul H. Siegel, and Jack K. Wolf. “Characterizing Flash Memory: Anomalies, Observations, and Applications.” In Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture, 24–33. MICRO 42. New York, NY, USA: ACM, 2009.
MLA
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Grupp, Laura M., et al. “Characterizing Flash Memory: Anomalies, Observations, and Applications.” Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture, ACM, 2009, pp. 24–33.
BibTeX Click to copy
@inproceedings{grupp2009a,
title = {Characterizing flash memory: anomalies, observations, and applications},
year = {2009},
address = {New York, NY, USA},
pages = {24--33},
publisher = {ACM},
series = {MICRO 42},
author = {Grupp, Laura M. and Caulfield, Adrian M. and Coburn, Joel and Swanson, Steven and Yaakobi, Eitan and Siegel, Paul H. and Wolf, Jack K.},
booktitle = {Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture}
}